Optical Near-field Electron Microscopy (ONEM): Damage-free, label-free super-resolution imaging of interfaces

Thomas Juffmann (U of Vienna)

Jun 10. 2026, 10:40 — 11:10

Optical Near-field Electron Microscopy (ONEM) is a new imaging approach that combines the non-invasiveness of light optics with high spatial resolution enabled by electron optics. The core idea is simple [1]: a specimen is illuminated with light, and the resulting near-field intensity patterns are converted into photoelectrons using a thin photocathode. Those photoelectrons are then imaged with a low-energy electron microscope, providing access to sub-diffraction near-field contrast with minimal invasiveness. Here, I will explain the underlying theory [1,2] and demonstrate that our prototype achieves a spatial resolution of better than 31 nm at Hz frame rates [3]. I will then present three illustrative applications: mapping polarisation-dependent plasmon modes in nanostructures, live imaging of E. coli in a liquid cell, and real-time visualisation of copper electrodeposition. These examples demonstrate ONEM’s unique combination of high spatial resolution, fast temporal response, and compatibility with liquid and electrochemical environments. I will finish by discussing technical challenges, expected improvements, and potential future directions in biology, electrochemistry, and nanophotonics.

[1] R. Marchand et al., Physical Review Applied 16 (1), 014008 (2021)

[2] L. Kienesberger et al., Physical Review Research 6 (2), 23204–23204 (2024)

[3] I. Zykov et al., submitted (2025)

Further Information
Venue:
ESI Boltzmann Lecture Hall
Associated Event:
Applications of Tomographic Methods (Workshop)
Organizer(s):
Wolfgang Drexler (Med U Vienna)
Peter Elbau (U of Vienna)
Ronny Ramlau (RICAM, Linz)
Monika Ritsch-Marte (Med Uni Innsbruck)
Otmar Scherzer (U of Vienna)
Gerhard Schütz (TU Wien)
Gabriele Steidl (TU Berlin)
Glenn van de Ven (U of Vienna)