Modeling of Crystalline Interfaces and Thin Film Structures: A Joint Mathematics-Physics Symposium


The analysis of crystalline interfaces, such as thin films and grain boundaries, is crucial for the design, development, and application of various modern materials. During the epitaxial growth of thin films and the self-assembly of crystalline nanostructures, multi-scale phenomena take place and the microscopic morphology strongly impacts the material macroscopic properties. Any progress in the modeling of interface-pattern formations carries in principle the potential for a significant technological impact.


The workshop aims at presenting the state of the art and the most recent advancements in the derivation, validation, and implementation of reliable models for the characterization of interface crystalline morphologies. New results will be presented both at the analytical and at the experimental level. On the one hand interface morphologies will be analytically characterized as minimizers of configurational energies in the framework of the Calculus of Variations or as solutions of evolutionary PDEs. On the other hand solutions and challenges encountered in experiments when growing supported nanostractures for example by Molecular Beam Epitaxy (MBE) and Pulsed Laser Deposition (PLD) will be presented.


1. Derivation of models for crystalline interfaces.
2. Crystal-interface regularity and geometric properties.
3. Thin-film growth and evolution of crystal interfaces.
4. Growth challenges in experiments and applications to technology.

Schedule (pdf)

Coming soon.


Name Affiliation
Ulrike Diebold Technical University of Vienna
Irene Fonseca Carnegie Mellon University
Paolo Piovano University of Vienna


Name Affiliation
Roberto Alicandro University of Cassino
Stefano Almi University of Vienna
Peter Bella Technical University Dortmund
Giovanni Bellettini University of Siena
Anne Bernand-Mantel INSA Toulouse
Laurent Betermin University of Vienna
Andrea Braides University of Rome Tor Vergata
Katharina Brazda University of Vienna
Marco Bresciani University of Vienna
Maicol Caponi University Federico II of Napoli
Davide Carazzato Scuola Normale Superiore
Antonin Chambolle Ecole Polytechnique, Palaiseau
Marco Cicalese Technical University of Munich
Gianni Dal Maso SISSA
Elisa Davoli University of Vienna
Patrick Dondl University of Freiburg
James Evans Iowa State University
Silvio Fanzon University of Graz
Julian Fischer Institute of Science and Technology Austria
Matteo Focardi University of Florence
Maria Stella Gelli University of Pisa
Michael Goldman University Paris-Diderot
Sebastian Hensel Institute of Science and Technology Austria
Shokhrukh Kholmatov University of Vienna
Giuliano Lazzaroni University of Florence
Giovanni Leoni Carnegie Mellon University
Jian-Guo Liu Duke University
Randy Llerena University of Vienna
Mattia Magnabosco Scuola Normale Superiore
Alice Marveggio Institute of Science and Technology Austria
Tevfik Onur Mentes Elettra
Anastasia Molchanova University of Vienna
Marco Morandotti Politecnico di Torino
Massimiliano Morini University of Parma
Cyrill Muratov New Jersey Institute of Technology
Matteo Novaga University of Pisa
Valerio Pagliari University of Vienna
Mariapia Palombaro University of L'Aquila
Aldo Pratelli University of Pisa
Guus Rijnders University of Twente
Filippo Riva SISSA
Michele Riva Technical University of Vienna
Tomàś Roubíček Charles University Prague
Francesco Sapio Wolfgang Pauli Institute
Bernd Schmidt University Augsburg
Tomas Šikola University of Technology Brno
Thilo Simon University of Bonn
David Srolovitz City University of Hong Kong
Ulisse Stefanelli University of Vienna
Emanuele Tasso Technical University Dresden
Christian Teichert University of Leoben
Igor Velčić University of Zagreb
Michael Wolloch Technical University of Vienna
Barbara Zwicknagl Humboldt University
At a glance
Nov. 11, 2019 — Nov. 15, 2019
ESI Boltzmann Lecture Hall
Ulrike Diebold (TU Vienna)
Irene Fonseca (Carnegie Mellon U, Pittsburgh)
Paolo Piovano (U of Vienna)